JEOL Fine Process Inspection
Available Models
Focused Ion Beam:
JFS-9855S
JEM-9320FIB
200kV TEM:
JEM-2500SE
Mask Measurement:
EMU-220/330 CD-SEM
JEOL Fine Process Inspection
Available Models
Focused Ion Beam:
JEM-9320FIB
200kV TEM:
JEM-2500SE
Mask Measurement:
EMU-220/330 CD-SEM
Please Note
Not all JEOL products are available in every country. For specific information and more details about JEOL products available in your area, contact your local JEOL office or sales representative. Thank you.