JEOL Conventional Tungsten High/Low Vacuum SEMs
- High Vacuum: Ideal for failure analysis, inspection, and characterization.
- Low Vacuum: For imaging and X-ray analysis of wet, nonconductive, unprepared samples.
Available Models
| |
Resolution |
Accelerating
Voltage |
Magnification |
Stage |
| JSM-6510 |
3.0nm |
0.3 to 30 kV |
x5 to 300,000
(printed as a 128mm x 96mm micrograph) |
GS Type: X=20mm, Y=10mm |
| LGS Type: X=80mm, Y=40mm |
| JSM-6510LV |
HV 3.0nm
LV 4.0nm |
0.5 to 30 kV |
x5 to 300,000
(printed as a 128mm x 96mm micrograph) |
GS Type: X=20mm, Y=10mm |
| LGS Type: X=80mm, Y=40mm |
| JSM-6610 |
3.0nm |
0.3 to 30 kV |
x5 to 300,000
(printed as a 128mm x 96mm micrograph) |
X=125mm, Y=100mm |
|
JSM-6610LV
|
HV 3.0nm
LV 4.0nm |
0.3 to 30 kV |
x5 to 300,000
(printed as a 128mm x 96mm micrograph) |
X=125mm, Y=100mm |
| JCM-5700 |
5.0nm |
0.5 to 20 kV |
x8 to 300,000
(printed as a 128mm x 96mm micrograph) |
GS Type: X=20mm, Y=10mm, Z=5mm-48mm |
| MS Type: X=80mm, Y=40mm, Z=5mm-48mm |
| JCM-5000 |
|
15 kV, 10 kV, 5kV
(3-position switch) |
x10 to 20,000
(printed as a 128mm x 96mm micrograph) |
Manual control for X and Y
X: 35mm, Y: 35mm |
Please Note
Not all JEOL products are available in every country. For specific information and more details about JEOL products available in your area, contact your local JEOL office or sales representative. Thank you.