JEOL Conventional Thermal FE SEMs
- Field emission source provides higher resolution; high stability and high current in a small spot size and generates high x-ray fluxes for chemical analysis at high resolution conditions.
- A new low vacuum FE SEM is also available.
Available Models
| |
Gun Type |
Resolution |
Accelerating
Voltage |
Magnification |
Stage |
| JSM-7001F |
in-lens thermal |
1.2nm (30kV)
3.0nm (1kV)
3.0nm (15kV
10mm WD
5namp Ip) |
0.5 to 30 kV |
x10 to 1,000,000x
(printed as a 120mm x 90mm micrograph) |
Type I
X=70mm,
Y=50mm
Type II
X=110mm,
Y=80mm
Type III
X=140mm, Y=80mm
|
Please Note
Not all JEOL products are available in every country. For specific information and more details about JEOL products available in your area, contact your local JEOL office or sales representative. Thank you.