JEOL Semi-in-Lens Cold Cathode FE SEMs
- Highest resolution SEMs; the cold cathode produces the finest probe size, especially at low accelerating voltages; the semi-in-lens pulls the secondary electrons off the surface by a detector in the objective lens, reducing noise at lower working distances.
Available Models
| |
Resolution |
Accelerating
Voltage |
Magnification |
Stage |
| JSM-6701F |
1.0nm
2.2nm (1kV) |
0.5 to 30 kV |
x25 to 650,000
(printed as a 120mm x 90mm micrograph) |
Type I
X=70mm,
Y=50mm
Type II
X=110mm,
Y=80mm
Type III
X=140mm,
Y=80mm
|
| JSM-7500F |
1.0nm (15kV)
1.4nm (1kV)
0.6nm (30kV) attainable |
0.1 to 30 kV |
x25 to 1,000,000
(printed as a 120mm x 90mm micrograph) |
| JSM-7600F |
1.0nm (15kV)
1.5nm (1kV)
0.6nm (30kV) attainable |
0.1 to 30 kV |
x25 to 1,000,000
(printed as a 120mm x 90mm micrograph) |
Please Note
Not all JEOL products are available in every country. For specific information and more details about JEOL products available in your area, contact your local JEOL office or sales representative. Thank you.