JSPM-5200 Scanning Probe Microscope
The JSPM-5200 is a multipurpose, high resolution SPM offering ease of use with diverse measurement and sample environments. The JSPM-5200 can be used in various native environments -- from ambient air, controlled atmosphere, fluid, or vacuum, with the sample heated to 500° C (773K) or cooled to -143° C (130K). The JSPM-5200 can also perform a wide range of applied measurements including the combination of image signals and instantaneous switching between operation modes. The open architecture of the JSPM-5200 provides multiple access ports and easy access to the probe. The JSPM-5200 can be configured as either an atomic force microscope (AFM) or scanning tunneling microscope (STM) by merely changing the tip. STM modes include CITS, I-V, S-V, and I-S. Standard AFM modes include contact, friction force microscopy, current image, non-contact and discrete contact with either slope detection or frequency detection, and phase imaging. A patented drift-free stage is implemented to provide an extremely stable imaging platform.