JWS-7855S Mask Observation Scanning Microscope
The JWS-7855S Mask Observation Scanning Microscope has a stable thermal field emission electron gun, high tilt angle stage and specimen handling mechanism for the observing of reticules. The JWS-7855S allows for a specimen to be tilted from 0° to 60° without changing the field of view or focus. The JWS-7855S can also rapidly change from 800 volts to 12,000 volts for superior EDS analysis.
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