JEM-1400 Transmission Electron Microscope
The JEM-1400 is a high performance, high contrast, 120kV TEM with excellent imaging and analytical capabilities in one compact, easy-to-use instrument. With an acceleration voltage of 40 to 120kV, the JEM-1400 is suitable for biological, polymer and materials science applications.
The new JENIE™ software included with the JEM-1400 offers a set of tutorials and user guides designed to help beginning microscopists familiarize themselves with the microscope, but also allows experienced users to explore and understand advanced features. The Windows™ GUI is programmed with the latest in Windows™ based technologies and allows remote operation and communication between groups via a TCP/IP connection and a web browser.
The JEM-1400 also supports optional STEM digital imaging/scanning circuitry which displays STEM images (BF/DF) on the standard GUI. An EDS can be added for elemental mapping.
JEM-1400 Specifications
| |
HC
High Contrast |
STEM |
| TEM Mode |
STEM Mode |
Resolution
Lattice Image
Point Image |
0.20nm
0.38nm |
0.20nm
0.38nm |
-
- |
Accelerating Voltage
Steps (5)
Variable Steps
Stability |
40 - 120 kV
33 V min. step
2 x 10-6/min. |
Magnification
Mag Mode
Low Mag Mode
SA Mag Mode |
x200-1,200,000
x50-1,000
x2,000-300,000 |
x2,000-1,200,000
x50-1,000
x2,000-300,000 |
x5,000-2,000,000
x120-4,000
- |
Specimen Chamber
Specimen per Load
Specimen Tilt Angle (X-axis) |
1
±25° (±70° with optional holder |
JEM-1400 Specifications
| |
HC
High Contrast |
STEM |
| TEM Mode |
STEM Mode |
Resolution
Lattice Image
Point Image |
0.20nm
0.38nm |
0.20nm
0.38nm |
-
- |
Accelerating Voltage
Steps (5)
Variable Steps
|
40 - 120 kV
33 V min. step |
Magnification
Mag Mode
Low Mag Mode
SA Mag Mode |
x200-1,200,000
x50-1,000
x2,000-300,000 |
x200-1,200,000
x50-1,000
x2,000-300,000 |
x5,000-2,000,000
x120-4,000
- |
Specimen Chamber
Specimen per Load
Specimen Tilt Angle (X-axis) |
1
±25° (±70° with optional holder |