JIB-4500 MultiBeam SEM-FIB

MultiBeam, a new high performance SEM and micro milling FIB, combines the most popular LaB₆ electron column in the world with real time milling and monitoring capability. The JIB-4500 MultiBeam delivers high throughput and increased productivity with simultaneous viewing, analysis, and micro milling functions for a variety of applications.

Versatility

• Low vacuum operation for imaging non-conductive specimens without coating or alteration
• A gas injection system for etching and deposition
• A large stage for up to 76mmΦ samples
• A multiple port design for all your analytical needs

Productivity

• Serial slicing and sampling (S³) for monitoring, slicing, fabrication and reconstructing 3D images
• Maximum milling current for high throughput
• Standard airlock system for fast sample loading

Stability

• Provides stable imaging for milling / monitoring over extended periods of time
• High throughput milling of large areas (max milling current 30 nA)
• 5-axis eucentric goniometer stage

Please Note

Not all JEOL products are available in every country. For specific information and more details about JEOL products available in your area, contact your local JEOL office or sales representative. Thank you.