JEOL (UK) Ltd

Welcome to JEOL (UK) Ltd

From our office in Welwyn Garden City, Hertfordshire, JEOL (UK) Ltd offer sales, support and applications training for a wide variety of scanning electron microscopes (SEM), scanning probe microscopes, transmission electron microscopes (TEM), NMR spectrometers, ESR spectrometers, mass spectrometers, amino acid analysers and semiconductor process equipment. As one of the worlds leading suppliers of scientific equipment, we are proud to offer our customers the highest level of sales and technical support maximising their investment in JEOL products

Established for 40 years, JEOL (UK) Ltd is part of a world wide network of JEOL companies, with their head office in Akishima, Tokyo

Featured Product

JSX-3400R
The JSX-3400R is an element analyzer (energy dispersive fluorescent X-ray analyzer) designed for environmental studies The JSX-3400R complies to two directives of the European Union (EU) --WEEE and RoHS (Restricting the use of Hazardous Substances) ---->

Latest JEOL News

Second user instruments for sale
JXA-8600 Microprobe and JEM-2010 Transmission Electron Microscope more »

An Introduction - Transmission Electron Microscopy
JEOL (UK) Ltd. are pleased to announce the first of the company’s new training courses, an 'Introduction to Transmission Electron Microscopy', which will be held on 13th-15th January 2009 in our Welwyn Garden City demonstration centre. more »

JEOL at SMASH 2008
JEOL is proud to support the SMASH 2008 Conference more »

JEOL at BMSS 2008
This year, BMSS is to be held at The Exhibition Centre, University of York, Heslington, York from Sunday 7th to Wednesday 10th September 2008 more »

Major Prize Awarded to Kenyan Microscopist
JEOL and Advanced Laboratory Solutions (JEOL’s South African representative) sponsor a major prize awarded during the Microscopy Society of Southern Africa's annual meeting more »

JEOL’s first Field Emission TEM in South Africa
At the beginning of July, 2008, JEOL’s first Field Emission TEM system in South Africa, a 200 kV JEM-2100F, was signed-off by the University of Pretoria. The High Tilt objective polepiece guarantees both 0.25 nm point resolution and ±80° sample tilt more »

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