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  The Rosalind Franklin Institute purchase JEOL JIB-4700F FIB-SEM Multi Beam System

  Following the announcement in February 2018 of an initial £1.55m investment to fund the development of a unique time-resolved high-resolution transmission electron microscope, the purchase of the JEOL FIB with assistance from the MRC, Diamond Light Source and the RCaH, is the first stage in what will be a long term project. The newly developed JIB-4700F utilises a Focussed Ion Beam column with a high-current density Ga ion source providing up to 90nA of probe-current. The high current provides for the fast ion milling and processing of specimens. The SEM optics feature an "in-lens Schottky-emission electron gun" that produces an electron beam with a maximum probe-current of 300nA, which allows for simultaneous high-resolution observations and fast analyses. This field emission SEM additionally features a hybrid conical objective lens, GENTLEBEAM™ (GB) mode and an in-lens detector system to deliver a guaranteed resolution of 1.6nm at a low accelerating voltage of 1 kV. In parallel with high-speed cross-section processing by FIB, high-resolution SEM observations and fast analyses can be conducted utilizing energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). Additionally, a ...
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  Launch of the FIB-SEM System "JIB-PS500i" with High Precision and High Resolution

  PRESS RELEASE  Release Date: 2023/02/01 JEOL Ltd. (President & CEO Izumi Oi) announces its launch of the FIB-SEM system "JIB-PS500i" on February 1, 2023.  With the finer structure of advanced materials and advancing complexity of processes, evaluation techniques such as morphological observation and elemental analysis require higher resolution and precision. In the preparation of samples for transmission electron microscopes (TEM) in the semiconductor industry as well as in the battery and materials fields, "higher precision" and "thinner sample" are required.   This product is a combined system of the FIB (Focused Ion Beam) system that can process with high accuracy and the SEM (scanning electron microscope) of high resolution to satisfy these needs.  Click here for more information.  
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  Introducing JASON - next-generation analytical software

  JASON is next-generation analytical software with special emphasis on the automatic processing, analysis, and reporting of NMR data.  Click here to find out more.   
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  EUROMAR 2022

  We are proud to be sponsoring EUROMAR 2022 again this year, in the beautiful city of Utrecht, The Netherlands!  EUROMAR covers all aspects of Magnetic Resonance, including Nuclear Magnetic Resonance (NMR), Electron Spin Resonance (ESR), and Magnetic Resonance Imaging (MRI). It combines keynote and invited lectures, lectures selected from abstracts, and poster sessions. It is the European conference to discuss all aspects of Magnetic Resonance and network with vendors and colleagues. Join us on July 10-14, 2022.  Follow us on social media (@JEOLEUROPE, @JEOLJASON) for updates about JEOL's activities and events at EUROMAR 2022.  We looking forward to welcoming you all to the JEOL booth. See you in Utrecht!  
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  JEOL News

  The 2021 edition of the JEOL NEWS magazine is now available to download. Download here. Featured Applications: Progress in Photonic Crystal Lasers and Their Application to LiDAR And Yet It Moves: Molecular Rotors and Motors Studied by Solid-State NMR Spectroscopy Dioxins Analysis with New GC-MS/MS System and Software "TQ-DioK" Characterization of Localized Physical Properties Using High Resolution EELS In-Resin CLEM of Epon-Embedded Cells Using Fluorescent Proteins Degradation Analysis for Polymer Materials by Spin-Trapping High-Speed Electron Beam Modulation System Using Electrostatic Deflection and Laser Delivery System to the Specimen in Transmission Electron Microscopy The New Detection System of High-End FE-SEM JSM-IT800 Super Hybrid Lens ＜SHL＞ Preparation of TEM Specimens Having Specific Crystal Orientations Using FIB-SEM and EBSD ～ Applications to Allende meteorite ～ Chemical Bonding State Analysis of Boron and Phosphorus Compounds by Soft X-ray Emission Spectroscopy and Electronic Structure Calculations Chemical State Analysis of Fe in the Matrix of the Allende Meteorite Using an FEG EPMA and SXES MultiAnalyzer – Unknown Compounds Analysis System New Gas Chromatograph Time-of-Flight Mass Spectrometer JMS-T2000GC "AccuTOF™ GC-Alpha" Introduction of JEOL Products  
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  Ground-breaking new data - recording atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nano structures in a TEM

  Data from a JEOL 300kV TEM, JEM-ARM300F, and a new laser system by IDES, Inc. will be presented by the research team of AIST and Osaka University at M&M 2021. The research group of Dr. Ryousuke Senga, Electron Microscopy Group, Nanomaterials Research Institute, Advanced Industrial Science and Technology (AIST) and Professor Kazutomo Suenaga, Department of Nanocharacterization for Nanostructures and Functions, Nanoscience and Nanotechnology Center, The Institute of Scientific and Industrial Research (ISIR: SANKEN), Osaka University, succeeded in recording atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nano structures in a transmission electron microscope (TEM). The structures were formed by laser irradiation of samples made of carbon films and iron nanoparticles. This experiment was conducted using a JEOL 300kV Transmission Electron Microscope with a cold field emission gun, JEM-ARM300F, and a new system designed by JEOL subsidiary Integrated Dynamic Electron Solutions, Inc. for precisely focusing lasers onto TEM samples, Luminary Micro. This combination of high-performance imaging instrumentation and reduced sample motion due to precision-controlled rapid localized illumination enables extraordinary spatial resolution for in-situ experiments. The details of this research will be ...