JEOL UK News
Press releases, announcements, awards, and news
JEOL announces the release of two new Cross Section Polishers for Electron Microscopes.
☑ New GUI and Internet of Things (IoT) ～ user-friendly and remote control-enabled.
☑ High throughput ion source.
☑ High throughput cooling system ～ auto cooling and auto return to room temperature.
Click below to learn more or contact your local JEOL office.
Product info HERE🔗
News release HERE 🔗
Field Emission Scanning Electron Microscopes (FE-SEM) are widely used in science and technology fields such as research institutes, universities, and industry. There is a growing demand for an instrument that can be used easily, accurately, quickly, and efficiently from observation to analysis.
The JSM-IT810 adds the "Neo Action" automatic observation and analysis function and automatic calibration function to the JSM-IT800, which is equipped with the next-generation electron optical control system “Neo Engine” and the "SEM Center" for high operability such as Zeromag and EDS integration, to not only improve efficiency and productivity but also help solve labor shortages.
Main Features
1. Automatic Observation and Analysis Function "Neo Action"
All you need to do is select the SEM image acquisition conditions and field of view, and the function automatically performs SEM observation and EDS (energy dispersive X-ray spectroscopy) analysis. This function contributes to improving the efficiency of routine work including analysis work.
2. Automatic Calibration Function "SEM Automatic Adjustment Package"
This function enables automatic execution of the selected items in alignment adjustment, magnification adjustment, and EDS energy calibration.
3. "Live Function"
This function is capable of Live 3D, Live Analysis, and Live Map functions. 3D images can be constructed on the spot while an SEM observation is being performed to obtain unevenness and depth information. In addition, it helps always display characteristic X-ray spectrum and elemental mapping.
4. EDS Integration
Observation by an SEM and analysis by an EDS are integrated. Analysis of point, area, and MAP can be performed from the observation screen. Incorporation of the Windowless EDS-Gather-X enables detection from Li and analysis at a high sensitivity and high spatial resolution.
Click here to learn more.
• Brand new appearance and compact design
• Enhanced TEM control system and fully automated apertures
• Only four steps from loading a specimen to completing an observation
• Can be expanded at any time to meet the changing needs of microscopy over time
Find out more here. Or contact the JEOL UK sales team uk.sales@jeoluk.com.
PRESS RELEASE
Release Date: 2023/02/01
JEOL Ltd. (President & CEO Izumi Oi) announces its launch of the FIB-SEM system "JIB-PS500i" on February 1, 2023.
With the finer structure of advanced materials and advancing complexity of processes, evaluation techniques such as morphological observation and elemental analysis require higher resolution and precision. In the preparation of samples for transmission electron microscopes (TEM) in the semiconductor industry as well as in the battery and materials fields, "higher precision" and "thinner sample" are required.
This product is a combined system of the FIB (Focused Ion Beam) system that can process with high accuracy and the SEM (scanning electron microscope) of high resolution to satisfy these needs.
Click here for more information.
The latest version of our next-generation NMR analytical software 'JASON' is out now!
Download here
Easy to acquire data for all specimen types...
With the JSM-IT510, the newly added Simple SEM function allows users to "leave the manual repetitive operation to it", required for SEM observation, making SEM observation more efficient and easier.
Click here for full product information.
Video
The ECZ Luminous (JNM-ECZL series) is an FT NMR spectrometer equipped with state-of-the-art digital and high frequency technology. The highly integrated Smart Transceiver System, a high-speed, high-precision digital high-frequency control circuit, enables further miniaturization and high reliability of the spectrometer. It is capable of high-field and solid-state NMR measurements while maintaining the size of a conventional low-field solution NMR system.
The new Multi Frequency Drive System enables multi-resonance measurements in a standard configuration, providing a wider range of solutions.
Click here for more info.