JEOL UK News
Press releases, announcements, awards, and news
Release Date: 2023/03/09
With the exception of Japan, the University of Southampton will be the home to the world’s highest Accelerating Voltage Direct Writing Electron Beam Lithography (EBL) System. The system has Gaussian Beam Optics designed to implement High Throughput and High Precision requirements from a wide range of applications. The machine will be housed in a state-of-the-art facility for microfabrication and high-spec nanofabrication, with a wide range of characterisation capabilities, housed in a purpose built, 820m2 cleanroom in the Mountbatten Complex at the University of Southampton.
Click here to read the full press release.
Release Date: 2023/02/01
JEOL Ltd. (President & CEO Izumi Oi) announces its launch of the FIB-SEM system "JIB-PS500i" on February 1, 2023.
With the finer structure of advanced materials and advancing complexity of processes, evaluation techniques such as morphological observation and elemental analysis require higher resolution and precision. In the preparation of samples for transmission electron microscopes (TEM) in the semiconductor industry as well as in the battery and materials fields, "higher precision" and "thinner sample" are required.
This product is a combined system of the FIB (Focused Ion Beam) system that can process with high accuracy and the SEM (scanning electron microscope) of high resolution to satisfy these needs.
Click here for more information.
A new solution for advanced sample preparation. Follow us @JEOLEUROPE on social media in the coming weeks for further information.
Sneak a peek HERE
We are deeply saddened by the passing of Her Majesty Queen Elizabeth II. As we join the rest of the country in this period of national mourning and allow our staff to pay their respects, the JEOL (UK) Ltd. office will be closed on the day of Her Majesty Queen Elizabeth II’s State Funeral: Monday 19 September
We invite you to join our lunch symposiums during EUROMAR 2022. No need to register, places will be offered on a first-come, first-serve basis.
We look forward to seeing you in Utrecht!
Date: Monday, 11th July, 2022
Time: 12:45 - 13:45
Room: Megaron, Educatorium, Utrecht University
‘XtaLAB Synergy-ED: Micro-crystal electron diffraction made easy’
Dr. Robert Bücker, RIGAKU
‘Electron NMR crystallography: structure solution to microcrystals’
Dr. Yusuke Nishiyama
* 100 pieces of Japanese fried chicken Bento Box will be served
Date: Tuesday, 12th July, 2022
Time: 12:45 - 13:45
Room: Megaron, Educatorium, Utrecht University
‘Smaller, easier and faster New NMR system from JEOL ECZ Luminous’
Dr. Jumpei Hamatsu
‘JEOL's JASON: a new tool for NMR’
Dr. Manuel Perez
* 100 pieces of Japanese fried shrimp Bento Box will be served
We are proud to be sponsoring EUROMAR 2022 again this year, in the beautiful city of Utrecht, The Netherlands!
EUROMAR covers all aspects of Magnetic Resonance, including Nuclear Magnetic Resonance (NMR), Electron Spin Resonance (ESR), and Magnetic Resonance Imaging (MRI). It combines keynote and invited lectures, lectures selected from abstracts, and poster sessions. It is the European conference to discuss all aspects of Magnetic Resonance and network with vendors and colleagues.
Join us on July 10-14, 2022.
Follow us on social media (@JEOLEUROPE, @JEOLJASON) for updates about JEOL's activities and events at EUROMAR 2022.
We looking forward to welcoming you all to the JEOL booth. See you in Utrecht!
The latest version of our next-generation NMR analytical software 'JASON' is out now!
Easy to acquire data for all specimen types...
With the JSM-IT510, the newly added Simple SEM function allows users to "leave the manual repetitive operation to it", required for SEM observation, making SEM observation more efficient and easier.
Click here for full product information.
The ECZ Luminous (JNM-ECZL series) is an FT NMR spectrometer equipped with state-of-the-art digital and high frequency technology. The highly integrated Smart Transceiver System, a high-speed, high-precision digital high-frequency control circuit, enables further miniaturization and high reliability of the spectrometer. It is capable of high-field and solid-state NMR measurements while maintaining the size of a conventional low-field solution NMR system.
The new Multi Frequency Drive System enables multi-resonance measurements in a standard configuration, providing a wider range of solutions.
Click here for more info.
The 2021 edition of the JEOL NEWS magazine is now available to download.
- Progress in Photonic Crystal Lasers and Their Application to LiDAR
- And Yet It Moves: Molecular Rotors and Motors Studied by Solid-State NMR Spectroscopy
- Dioxins Analysis with New GC-MS/MS System and Software "TQ-DioK"
- Characterization of Localized Physical Properties Using High Resolution EELS
- In-Resin CLEM of Epon-Embedded Cells Using Fluorescent Proteins
- Degradation Analysis for Polymer Materials by Spin-Trapping
- High-Speed Electron Beam Modulation System Using Electrostatic Deflection and Laser Delivery System to the Specimen in Transmission Electron Microscopy
- The New Detection System of High-End FE-SEM JSM-IT800 Super Hybrid Lens ＜SHL＞
- Preparation of TEM Specimens Having Specific Crystal Orientations Using FIB-SEM and EBSD ～ Applications to Allende meteorite ～
- Chemical Bonding State Analysis of Boron and Phosphorus Compounds by Soft X-ray Emission Spectroscopy and Electronic Structure Calculations
- Chemical State Analysis of Fe in the Matrix of the Allende Meteorite Using an FEG EPMA and SXES
- MultiAnalyzer – Unknown Compounds Analysis System New Gas Chromatograph Time-of-Flight Mass Spectrometer JMS-T2000GC "AccuTOF™ GC-Alpha"
- Introduction of JEOL Products
Congratulations to our esteemed colleague Dr. Hideyuki Takahashi at JEOL Ltd. for winning the 2021 'Presidential Science Award' from the Microanalysis Society (MAS) for his long-term contribution to the field of microbeam analysis. He has been engaged in R&D and application development of electron probe microanalyzer and soft X-ray emission spectrometer since he joined JEOL.
We would like to thank Takahashi-san for all his hard work and dedication.
Data from a JEOL 300kV TEM, JEM-ARM300F, and a new laser system by IDES, Inc. will be presented by the research team of AIST and Osaka University at M&M 2021.
The research group of Dr. Ryousuke Senga, Electron Microscopy Group, Nanomaterials Research Institute, Advanced Industrial Science and Technology (AIST) and Professor Kazutomo Suenaga, Department of Nanocharacterization for Nanostructures and Functions, Nanoscience and Nanotechnology Center, The Institute of Scientific and Industrial Research (ISIR: SANKEN), Osaka University, succeeded in recording atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nano structures in a transmission electron microscope (TEM). The structures were formed by laser irradiation of samples made of carbon films and iron nanoparticles.
This experiment was conducted using a JEOL 300kV Transmission Electron Microscope with a cold field emission gun, JEM-ARM300F, and a new system designed by JEOL subsidiary Integrated Dynamic Electron Solutions, Inc. for precisely focusing lasers onto TEM samples, Luminary Micro. This combination of high-performance imaging instrumentation and reduced sample motion due to precision-controlled rapid localized illumination enables extraordinary spatial resolution for in-situ experiments.
The details of this research will be presented by Dr. Senga during the Microscopy and Microanalysis (M&M) 2021 Conference, held in the U. S. from 1st - 5th August 2021.
See the movies and full press release here.
We would like to welcome all EUROMAR 2021 delegates to join the JEOL events throughout the conference. You can still register for EUROMAR 2021 here.
On Tuesday 6th July, JEOL will be hosting a User Meeting with special guest speakers Professor Ulla Gro Nielsen from the University of Southern Denmark (SDU) and Professor Martin Dračínský from the Czech Academy of Sciences.
Click here for the full schedule of JEOL Events.
See you there!
JEOL Live Demo Shows at mmc2021 - BOOK NOW!
Click here for more information.
JEOL UK is proud to announce that the Scottish Cryo-EM consortium has chosen the JEOL JEM-Z300FSC CRYO ARM™ 300 as their preferred automated Cryo Transmission Electron Microscope (Cryo-TEM) for the Scottish Centre for Macromolecular Imaging (SCMI).
The SCMI consortium led by the MRC Centre for Virus Research (CVR) at The University of Glasgow, selected JEOL after a thorough evaluation of the competing technologies for cryo-TEM. The JEOL CRYO ARM™ 300 will be supported by a second TEM, the JEOL 200kV JEM-F200 “F2” Cryo-TEM.
Project lead and programme leader in the CVR, Dr David Bhella said:
“The mission of the CVR is to carry out fundamental research on viruses and viral diseases, translating the knowledge gained for the improvement of health and benefit of society.
Cryogenic transmission electron microscopy is revolutionising the field of structural biology. The SCMI represents a tremendous opportunity not only for the CVR, but also for Life Scientists throughout Scotland. The new facility will place Glasgow at the centre of vital structural biology research by offering world-class capability. The new technology will help us investigate key processes in cancer biology and infection”.
Cryo-EM has gained enormous momentum in recent years resulting in the award for the Nobel Prize in Chemistry.
Ultra-high resolution structural analysis of viruses and proteins derived from cryo-EM techniques such as Single Particle Analysis (SPA) require high stability hardware and software.
The JEOL CRYO ARM™ 300 is the latest offering in cryo-TEM, able to achieve unprecedented resolution and stability by including Cold Field Emission Gun; in-column Omega energy filter; Hole-Free Phase Plate; side-entry liquid nitrogen cooling stage and an automated 12 specimen storage and exchange system.
The JEM-F200 "F2” is a high throughput TEM and the only 200kV system in its class to offer a Cold Field Emission Gun. The 'F2' employs the latest JEOL innovations in an easy-to-use, extremely stable, high resolution imaging 200kV TEM with STEM. This makes it the ideal partner for any high-level cryo-TEM.
JEOL look forward to helping and supporting Dr David Bhella and colleagues in the SCMI consortium in their research activities using the new instruments.