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  Release of a New Cold Field Emission Cryo-Electron Microscope CRYO ARM™ 300 II (JEM-3300)

  JEOL Ltd. announces the release of a new cold field emission cryo-electron microscope (cryo-EM), the CRYO ARM™ 300 II (JEM-3300), to be released in January 2021. This new cryo-EM has been developed based on the concept of "Quick and easy to operate and get high-contrast and high-resolution images". CRYO ARM™ 300 II is a cryo-electron microscope that specializes in the observation of electron beam-sensitive specimens, such as protein, for single particle analysis, tomography, and MicroED. This system offers improved stability, throughput and ease of use compared to the previous generation of cryo-EMs. Moreover, this is an all-in-one system that can handle everything from screening to data acquisition, allowing for more flexibility in operation at the customer sites to meet the needs of the facility. These improvements allow users to obtain high-quality images by simple operations even for those who have never used an electron microscope before. News Release Product Information
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  Launch of the FIB-SEM System "JIB-PS500i" with High Precision and High Resolution

  PRESS RELEASE  Release Date: 2023/02/01 JEOL Ltd. (President & CEO Izumi Oi) announces its launch of the FIB-SEM system "JIB-PS500i" on February 1, 2023.  With the finer structure of advanced materials and advancing complexity of processes, evaluation techniques such as morphological observation and elemental analysis require higher resolution and precision. In the preparation of samples for transmission electron microscopes (TEM) in the semiconductor industry as well as in the battery and materials fields, "higher precision" and "thinner sample" are required.   This product is a combined system of the FIB (Focused Ion Beam) system that can process with high accuracy and the SEM (scanning electron microscope) of high resolution to satisfy these needs.  Click here for more information.  
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  Release of the new Scanning Electron Microscope JSM-IT510 Series InTouchScope™

  Easy to acquire data for all specimen types... With the JSM-IT510, the newly added Simple SEM function allows users to "leave the manual repetitive operation to it", required for SEM observation, making SEM observation more efficient and easier. Click here for full product information. Video
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  JEOL News

  The 2021 edition of the JEOL NEWS magazine is now available to download. Download here. Featured Applications: Progress in Photonic Crystal Lasers and Their Application to LiDAR And Yet It Moves: Molecular Rotors and Motors Studied by Solid-State NMR Spectroscopy Dioxins Analysis with New GC-MS/MS System and Software "TQ-DioK" Characterization of Localized Physical Properties Using High Resolution EELS In-Resin CLEM of Epon-Embedded Cells Using Fluorescent Proteins Degradation Analysis for Polymer Materials by Spin-Trapping High-Speed Electron Beam Modulation System Using Electrostatic Deflection and Laser Delivery System to the Specimen in Transmission Electron Microscopy The New Detection System of High-End FE-SEM JSM-IT800 Super Hybrid Lens ＜SHL＞ Preparation of TEM Specimens Having Specific Crystal Orientations Using FIB-SEM and EBSD ～ Applications to Allende meteorite ～ Chemical Bonding State Analysis of Boron and Phosphorus Compounds by Soft X-ray Emission Spectroscopy and Electronic Structure Calculations Chemical State Analysis of Fe in the Matrix of the Allende Meteorite Using an FEG EPMA and SXES MultiAnalyzer – Unknown Compounds Analysis System New Gas Chromatograph Time-of-Flight Mass Spectrometer JMS-T2000GC "AccuTOF™ GC-Alpha" Introduction of JEOL Products  
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  University of Southampton to receive the first JBX-8100FS G3

  PRESS RELEASE  Release Date: 2023/03/09 With the exception of Japan, the University of Southampton will be the home to the world’s highest Accelerating Voltage Direct Writing Electron Beam Lithography (EBL) System.  The system has Gaussian Beam Optics designed to implement High Throughput and High Precision requirements from a wide range of applications. The machine will be housed in a state-of-the-art facility for microfabrication and high-spec nanofabrication, with a wide range of characterisation capabilities, housed in a purpose built, 820m2 cleanroom in the Mountbatten Complex at the University of Southampton. Click here to read the full press release.  
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  The Rosalind Franklin Institute purchase JEOL JIB-4700F FIB-SEM Multi Beam System

  Following the announcement in February 2018 of an initial £1.55m investment to fund the development of a unique time-resolved high-resolution transmission electron microscope, the purchase of the JEOL FIB with assistance from the MRC, Diamond Light Source and the RCaH, is the first stage in what will be a long term project. The newly developed JIB-4700F utilises a Focussed Ion Beam column with a high-current density Ga ion source providing up to 90nA of probe-current. The high current provides for the fast ion milling and processing of specimens. The SEM optics feature an "in-lens Schottky-emission electron gun" that produces an electron beam with a maximum probe-current of 300nA, which allows for simultaneous high-resolution observations and fast analyses. This field emission SEM additionally features a hybrid conical objective lens, GENTLEBEAM™ (GB) mode and an in-lens detector system to deliver a guaranteed resolution of 1.6nm at a low accelerating voltage of 1 kV. In parallel with high-speed cross-section processing by FIB, high-resolution SEM observations and fast analyses can be conducted utilizing energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). Additionally, a ...