JEOL UK News
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Data from a JEOL 300kV TEM, JEM-ARM300F, and a new laser system by IDES, Inc. will be presented by the research team of AIST and Osaka University at M&M 2021.
The research group of Dr. Ryousuke Senga, Electron Microscopy Group, Nanomaterials Research Institute, Advanced Industrial Science and Technology (AIST) and Professor Kazutomo Suenaga, Department of Nanocharacterization for Nanostructures and Functions, Nanoscience and Nanotechnology Center, The Institute of Scientific and Industrial Research (ISIR: SANKEN), Osaka University, succeeded in recording atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nano structures in a transmission electron microscope (TEM). The structures were formed by laser irradiation of samples made of carbon films and iron nanoparticles.
This experiment was conducted using a JEOL 300kV Transmission Electron Microscope with a cold field emission gun, JEM-ARM300F, and a new system designed by JEOL subsidiary Integrated Dynamic Electron Solutions, Inc. for precisely focusing lasers onto TEM samples, Luminary Micro. This combination of high-performance imaging instrumentation and reduced sample motion due to precision-controlled rapid localized illumination enables extraordinary spatial resolution for in-situ experiments.
The details of this research will be presented by Dr. Senga during the Microscopy and Microanalysis (M&M) 2021 Conference, held in the U. S. from 1st - 5th August 2021.
See the movies and full press release here.
JEOL Live Demo Shows at mmc2021 - BOOK NOW!
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Taking place for the first time virtually! mmc2021 will encompass an international scientific virtual conference (6 - 8 July) of six parallel streams, covering an enormous range of microscopy, cytometry and imaging topics. (The conference sessions will be recorded and available after their live scheduled time for those who registered for mmc2021. The recordings will be made available to view for a few weeks after mmc2021).
A huge FREE to ATTEND virtual exhibition (6 - 8 July) with companies both large and small showcasing their latest equipment and available to answer your questions
Virtual meetings & workshops covering the latest emerging topics (5 - 9 July)
Join the JEOL Commercial Workshops:
Tuesday 6 July at 12:45 – 13:15 BST
Presented by Andy Yarwood
Wednesday 7 July at 10:00 – 10:30 BST
‘Interface upgrades provide high-level control over JEOL TEM operation’
Presented by Bart Marzec
Wednesday 7 July at 12:15 – 12:45 BST
‘With open ARMs – JEOL Corrected Microscopy solutions for widening your capabilities’
Presented by Calum Dickinson
And don't forget to stop by our virtual exhibiton stand for information about our live demo shows.
See you there!
Missed our latest TEM and SEM webinar series? You can now catch up and watch them on-demand!
- 'Getting that Image - The TEM Column'
- 'More Than Just an Image - Dark Field and Diffraction'
- 'What's Gone Wrong - Common Issues on the TEM'
- 'Out in the Cold: CryoTEM'
- 'Discovering the Sparkle - Advanced Materials Techniques'
- 'Introduction to Scanning Electron Microscopy'
- 'Detectors and Optimisation of Images...looking at small things'
- 'Spectroscopy (EDS) in the SEM - how to find and identify impurities'
- 'Advanced imaging and spectroscopy and looking at tiny things'
- 'Addressing common sample issues'
We have an exciting new opportunity to join our high-end TEM service team at JEOL (UK) Ltd, providing service support for JEOL advanced TEM users in Israel.
Click here for the full job description.