JEOL UK News
Press releases, announcements, awards, and news
Release Date: 2023/02/01
JEOL Ltd. (President & CEO Izumi Oi) announces its launch of the FIB-SEM system "JIB-PS500i" on February 1, 2023.
With the finer structure of advanced materials and advancing complexity of processes, evaluation techniques such as morphological observation and elemental analysis require higher resolution and precision. In the preparation of samples for transmission electron microscopes (TEM) in the semiconductor industry as well as in the battery and materials fields, "higher precision" and "thinner sample" are required.
This product is a combined system of the FIB (Focused Ion Beam) system that can process with high accuracy and the SEM (scanning electron microscope) of high resolution to satisfy these needs.
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A new solution for advanced sample preparation. Follow us @JEOLEUROPE on social media in the coming weeks for further information.
Sneak a peek HERE
The latest version of our next-generation NMR analytical software 'JASON' is out now!
Easy to acquire data for all specimen types...
With the JSM-IT510, the newly added Simple SEM function allows users to "leave the manual repetitive operation to it", required for SEM observation, making SEM observation more efficient and easier.
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The ECZ Luminous (JNM-ECZL series) is an FT NMR spectrometer equipped with state-of-the-art digital and high frequency technology. The highly integrated Smart Transceiver System, a high-speed, high-precision digital high-frequency control circuit, enables further miniaturization and high reliability of the spectrometer. It is capable of high-field and solid-state NMR measurements while maintaining the size of a conventional low-field solution NMR system.
The new Multi Frequency Drive System enables multi-resonance measurements in a standard configuration, providing a wider range of solutions.
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Data from a JEOL 300kV TEM, JEM-ARM300F, and a new laser system by IDES, Inc. will be presented by the research team of AIST and Osaka University at M&M 2021.
The research group of Dr. Ryousuke Senga, Electron Microscopy Group, Nanomaterials Research Institute, Advanced Industrial Science and Technology (AIST) and Professor Kazutomo Suenaga, Department of Nanocharacterization for Nanostructures and Functions, Nanoscience and Nanotechnology Center, The Institute of Scientific and Industrial Research (ISIR: SANKEN), Osaka University, succeeded in recording atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nano structures in a transmission electron microscope (TEM). The structures were formed by laser irradiation of samples made of carbon films and iron nanoparticles.
This experiment was conducted using a JEOL 300kV Transmission Electron Microscope with a cold field emission gun, JEM-ARM300F, and a new system designed by JEOL subsidiary Integrated Dynamic Electron Solutions, Inc. for precisely focusing lasers onto TEM samples, Luminary Micro. This combination of high-performance imaging instrumentation and reduced sample motion due to precision-controlled rapid localized illumination enables extraordinary spatial resolution for in-situ experiments.
The details of this research will be presented by Dr. Senga during the Microscopy and Microanalysis (M&M) 2021 Conference, held in the U. S. from 1st - 5th August 2021.
See the movies and full press release here.
The Alpha takes you to a new world of mass spectrometry.
JEOL Ltd. (President & COO Izumi Oi) announces the release of JMS-T2000GC "AccuTOF™ GC-Alpha", the latest model of the successful AccuTOF™ GC series gas chromatograph – time-of-flight mass spectrometers, to be released in February 2021. This product is a GC-MS that represents a significant improvement in performance and functionality using two newly developed Key Technologies. The basic hardware performance has been greatly improved and a new generation of automated data analysis software is included in the standard configuration.
JEOL Ltd. announces the release of a new cold field emission cryo-electron microscope (cryo-EM), the CRYO ARM™ 300 II (JEM-3300), to be released in January 2021. This new cryo-EM has been developed based on the concept of "Quick and easy to operate and get high-contrast and high-resolution images".
CRYO ARM™ 300 II is a cryo-electron microscope that specializes in the observation of electron beam-sensitive specimens, such as protein, for single particle analysis, tomography, and MicroED. This system offers improved stability, throughput and ease of use compared to the previous generation of cryo-EMs. Moreover, this is an all-in-one system that can handle everything from screening to data acquisition, allowing for more flexibility in operation at the customer sites to meet the needs of the facility. These improvements allow users to obtain high-quality images by simple operations even for those who have never used an electron microscope before.
Past JEOL webinar recordings are now available for you to watch on-demand.