Release Date: 2023/02/01
JEOL Ltd. (President & CEO Izumi Oi) announces its launch of the FIB-SEM system "JIB-PS500i" on February 1, 2023.
With the finer structure of advanced materials and advancing complexity of processes, evaluation techniques such as morphological observation and elemental analysis require higher resolution and precision. In the preparation of samples for transmission electron microscopes (TEM) in the semiconductor industry as well as in the battery and materials fields, "higher precision" and "thinner sample" are required.
This product is a combined system of the FIB (Focused Ion Beam) system that can process with high accuracy and the SEM (scanning electron microscope) of high resolution to satisfy these needs.
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