Related Posts

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  Release of a New Cold Field Emission Cryo-Electron Microscope CRYO ARM™ 300 II (JEM-3300)

  JEOL Ltd. announces the release of a new cold field emission cryo-electron microscope (cryo-EM), the CRYO ARM™ 300 II (JEM-3300), to be released in January 2021. This new cryo-EM has been developed based on the concept of "Quick and easy to operate and get high-contrast and high-resolution images". CRYO ARM™ 300 II is a cryo-electron microscope that specializes in the observation of electron beam-sensitive specimens, such as protein, for single particle analysis, tomography, and MicroED. This system offers improved stability, throughput and ease of use compared to the previous generation of cryo-EMs. Moreover, this is an all-in-one system that can handle everything from screening to data acquisition, allowing for more flexibility in operation at the customer sites to meet the needs of the facility. These improvements allow users to obtain high-quality images by simple operations even for those who have never used an electron microscope before. News Release Product Information
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  TEM and SEM Webinar Series

  Missed our latest TEM and SEM webinar series? You can now catch up and watch them on-demand! TEM Series 'Getting that Image - The TEM Column'  https://attendee.gotowebinar.com/recording/8709415633094680589 'More Than Just an Image - Dark Field and Diffraction'  https://attendee.gotowebinar.com/recording/5090231273579657486 'What's Gone Wrong - Common Issues on the TEM'  https://attendee.gotowebinar.com/recording/3167978184792726024 'Out in the Cold: CryoTEM'  https://attendee.gotowebinar.com/recording/1744093035256080897 'Discovering the Sparkle - Advanced Materials Techniques'  https://attendee.gotowebinar.com/recording/2525422490937777676 SEM Series 'Introduction to Scanning Electron Microscopy'  https://attendee.gotowebinar.com/recording/4863182120121459211 'Detectors and Optimisation of Images...looking at small things'  https://attendee.gotowebinar.com/recording/5311188028618288902 'Spectroscopy (EDS) in the SEM - how to find and identify impurities'  https://attendee.gotowebinar.com/recording/3609586032650231308  'Advanced imaging and spectroscopy and looking at tiny things'  https://attendee.gotowebinar.com/recording/883527271641425421 'Addressing common sample issues'  https://attendee.gotowebinar.com/recording/2635235112308514572
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  One-of-a-kind Microscope Enables Breakthrough in Quantum Science

  We are pleased to share that the paper by Prof. Ido Kaminer and team at Technion – Israel Institute of Technology has been published in Nature. Prof. Ido Kaminer uses our Transmission Electron Microscope "JEM-2100Plus" and the equipment made by INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC. (California, USA), which became our wholly-owned subsidiary in January 2020. Press Release
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  Release of the new gas chromatograph – time-of-flight mass spectrometer JMS-T2000GC AccuTOF™ GC-Alpha – the ultimate GC-MS with superior performance and ease of operation

  The Alpha takes you to a new world of mass spectrometry. JEOL Ltd. (President & COO Izumi Oi) announces the release of JMS-T2000GC "AccuTOF™ GC-Alpha", the latest model of the successful AccuTOF™ GC series gas chromatograph – time-of-flight mass spectrometers, to be released in February 2021. This product is a GC-MS that represents a significant improvement in performance and functionality using two newly developed Key Technologies. The basic hardware performance has been greatly improved and a new generation of automated data analysis software is included in the standard configuration. News Release Product Information
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  Acquisition of INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.

  JEOL Ltd. (headquartered in Akishima, Tokyo; JEOL hereafter) acquired all shares of INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC. (headquartered in California, USA; IDES hereafter), an entrepreneurial venture specialized in technologies related to transmission electron microscopy (TEM hereafter), and made IDES its wholly-owned subsidiary. Read the full press release here
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  The Rosalind Franklin Institute purchase JEOL JIB-4700F FIB-SEM Multi Beam System

  Following the announcement in February 2018 of an initial £1.55m investment to fund the development of a unique time-resolved high-resolution transmission electron microscope, the purchase of the JEOL FIB with assistance from the MRC, Diamond Light Source and the RCaH, is the first stage in what will be a long term project. The newly developed JIB-4700F utilises a Focussed Ion Beam column with a high-current density Ga ion source providing up to 90nA of probe-current. The high current provides for the fast ion milling and processing of specimens. The SEM optics feature an "in-lens Schottky-emission electron gun" that produces an electron beam with a maximum probe-current of 300nA, which allows for simultaneous high-resolution observations and fast analyses. This field emission SEM additionally features a hybrid conical objective lens, GENTLEBEAM™ (GB) mode and an in-lens detector system to deliver a guaranteed resolution of 1.6nm at a low accelerating voltage of 1 kV. In parallel with high-speed cross-section processing by FIB, high-resolution SEM observations and fast analyses can be conducted utilizing energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). Additionally, a ...