Release of a New Cold Field Emission Cryo-Electron Microscope CRYO ARM™ 300 II (JEM-3300)
JEOL Ltd. announces the release of a new cold field emission cryo-electron microscope (cryo-EM), the CRYO ARM™ 300 II (JEM-3300), to be released in January 2021. This new cryo-EM has been developed based on the concept of "Quick and easy to operate and get high-contrast and high-resolution images".
CRYO ARM™ 300 II is a cryo-electron microscope that specializes in the observation of electron beam-sensitive specimens, such as protein, for single particle analysis, tomography, and MicroED. This system offers improved stability, throughput and ease of use compared to the previous generation of cryo-EMs. Moreover, this is an all-in-one system that can handle everything from screening to data acquisition, allowing for more flexibility in operation at the customer sites to meet the needs of the facility. These improvements allow users to obtain high-quality images by simple operations even for those who have never used an electron microscope before.