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  The Scottish Cryo-EM consortium has chosen the JEOL JEM-Z300FSC CRYO ARM™ 300

  JEOL UK is proud to announce that the Scottish Cryo-EM consortium has chosen the JEOL JEM-Z300FSC CRYO ARM™ 300 as their preferred automated Cryo Transmission Electron Microscope (Cryo-TEM) for the Scottish Centre for Macromolecular Imaging (SCMI).  The SCMI consortium led by the MRC Centre for Virus Research (CVR) at The University of Glasgow, selected JEOL after a thorough evaluation of the competing technologies for cryo-TEM.  The JEOL CRYO ARM™ 300 will be supported by a second TEM, the JEOL 200kV JEM-F200 “F2” Cryo-TEM. Project lead and programme leader in the CVR, Dr David Bhella said: “The mission of the CVR is to carry out fundamental research on viruses and viral diseases, translating the knowledge gained for the improvement of health and benefit of society. Cryogenic transmission electron microscopy is revolutionising the field of structural biology. The SCMI represents a tremendous opportunity not only for the CVR, but also for Life Scientists throughout Scotland.  The new facility will place Glasgow at the centre of vital structural biology research by offering world-class capability. The new technology will help us investigate key processes in cancer biology ...
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  Release of the new Scanning Electron Microscope JSM-IT510 Series InTouchScope™

  Easy to acquire data for all specimen types... With the JSM-IT510, the newly added Simple SEM function allows users to "leave the manual repetitive operation to it", required for SEM observation, making SEM observation more efficient and easier. Click here for full product information. Video
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  One-of-a-kind Microscope Enables Breakthrough in Quantum Science

  We are pleased to share that the paper by Prof. Ido Kaminer and team at Technion – Israel Institute of Technology has been published in Nature. Prof. Ido Kaminer uses our Transmission Electron Microscope "JEM-2100Plus" and the equipment made by INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC. (California, USA), which became our wholly-owned subsidiary in January 2020. Press Release
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  Release of the new gas chromatograph – time-of-flight mass spectrometer JMS-T2000GC AccuTOF™ GC-Alpha – the ultimate GC-MS with superior performance and ease of operation

  The Alpha takes you to a new world of mass spectrometry. JEOL Ltd. (President & COO Izumi Oi) announces the release of JMS-T2000GC "AccuTOF™ GC-Alpha", the latest model of the successful AccuTOF™ GC series gas chromatograph – time-of-flight mass spectrometers, to be released in February 2021. This product is a GC-MS that represents a significant improvement in performance and functionality using two newly developed Key Technologies. The basic hardware performance has been greatly improved and a new generation of automated data analysis software is included in the standard configuration. News Release Product Information
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  The Rosalind Franklin Institute purchase JEOL JIB-4700F FIB-SEM Multi Beam System

  Following the announcement in February 2018 of an initial £1.55m investment to fund the development of a unique time-resolved high-resolution transmission electron microscope, the purchase of the JEOL FIB with assistance from the MRC, Diamond Light Source and the RCaH, is the first stage in what will be a long term project. The newly developed JIB-4700F utilises a Focussed Ion Beam column with a high-current density Ga ion source providing up to 90nA of probe-current. The high current provides for the fast ion milling and processing of specimens. The SEM optics feature an "in-lens Schottky-emission electron gun" that produces an electron beam with a maximum probe-current of 300nA, which allows for simultaneous high-resolution observations and fast analyses. This field emission SEM additionally features a hybrid conical objective lens, GENTLEBEAM™ (GB) mode and an in-lens detector system to deliver a guaranteed resolution of 1.6nm at a low accelerating voltage of 1 kV. In parallel with high-speed cross-section processing by FIB, high-resolution SEM observations and fast analyses can be conducted utilizing energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). Additionally, a ...
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  Launch of the FIB-SEM System "JIB-PS500i" with High Precision and High Resolution

  PRESS RELEASE  Release Date: 2023/02/01 JEOL Ltd. (President & CEO Izumi Oi) announces its launch of the FIB-SEM system "JIB-PS500i" on February 1, 2023.  With the finer structure of advanced materials and advancing complexity of processes, evaluation techniques such as morphological observation and elemental analysis require higher resolution and precision. In the preparation of samples for transmission electron microscopes (TEM) in the semiconductor industry as well as in the battery and materials fields, "higher precision" and "thinner sample" are required.   This product is a combined system of the FIB (Focused Ion Beam) system that can process with high accuracy and the SEM (scanning electron microscope) of high resolution to satisfy these needs.  Click here for more information.