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  Release of a New Cold Field Emission Cryo-Electron Microscope CRYO ARM™ 300 II (JEM-3300)

  JEOL Ltd. announces the release of a new cold field emission cryo-electron microscope (cryo-EM), the CRYO ARM™ 300 II (JEM-3300), to be released in January 2021. This new cryo-EM has been developed based on the concept of "Quick and easy to operate and get high-contrast and high-resolution images". CRYO ARM™ 300 II is a cryo-electron microscope that specializes in the observation of electron beam-sensitive specimens, such as protein, for single particle analysis, tomography, and MicroED. This system offers improved stability, throughput and ease of use compared to the previous generation of cryo-EMs. Moreover, this is an all-in-one system that can handle everything from screening to data acquisition, allowing for more flexibility in operation at the customer sites to meet the needs of the facility. These improvements allow users to obtain high-quality images by simple operations even for those who have never used an electron microscope before. News Release Product Information
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  Release of the new Scanning Electron Microscope JSM-IT510 Series InTouchScope™

  Easy to acquire data for all specimen types... With the JSM-IT510, the newly added Simple SEM function allows users to "leave the manual repetitive operation to it", required for SEM observation, making SEM observation more efficient and easier. Click here for full product information. Video
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  Ground-breaking new data - recording atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nano structures in a TEM

  Data from a JEOL 300kV TEM, JEM-ARM300F, and a new laser system by IDES, Inc. will be presented by the research team of AIST and Osaka University at M&M 2021. The research group of Dr. Ryousuke Senga, Electron Microscopy Group, Nanomaterials Research Institute, Advanced Industrial Science and Technology (AIST) and Professor Kazutomo Suenaga, Department of Nanocharacterization for Nanostructures and Functions, Nanoscience and Nanotechnology Center, The Institute of Scientific and Industrial Research (ISIR: SANKEN), Osaka University, succeeded in recording atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nano structures in a transmission electron microscope (TEM). The structures were formed by laser irradiation of samples made of carbon films and iron nanoparticles. This experiment was conducted using a JEOL 300kV Transmission Electron Microscope with a cold field emission gun, JEM-ARM300F, and a new system designed by JEOL subsidiary Integrated Dynamic Electron Solutions, Inc. for precisely focusing lasers onto TEM samples, Luminary Micro. This combination of high-performance imaging instrumentation and reduced sample motion due to precision-controlled rapid localized illumination enables extraordinary spatial resolution for in-situ experiments. The details of this research will be ...
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  One-of-a-kind Microscope Enables Breakthrough in Quantum Science

  We are pleased to share that the paper by Prof. Ido Kaminer and team at Technion – Israel Institute of Technology has been published in Nature. Prof. Ido Kaminer uses our Transmission Electron Microscope "JEM-2100Plus" and the equipment made by INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC. (California, USA), which became our wholly-owned subsidiary in January 2020. Press Release
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  The Rosalind Franklin Institute purchase JEOL JIB-4700F FIB-SEM Multi Beam System

  Following the announcement in February 2018 of an initial £1.55m investment to fund the development of a unique time-resolved high-resolution transmission electron microscope, the purchase of the JEOL FIB with assistance from the MRC, Diamond Light Source and the RCaH, is the first stage in what will be a long term project. The newly developed JIB-4700F utilises a Focussed Ion Beam column with a high-current density Ga ion source providing up to 90nA of probe-current. The high current provides for the fast ion milling and processing of specimens. The SEM optics feature an "in-lens Schottky-emission electron gun" that produces an electron beam with a maximum probe-current of 300nA, which allows for simultaneous high-resolution observations and fast analyses. This field emission SEM additionally features a hybrid conical objective lens, GENTLEBEAM™ (GB) mode and an in-lens detector system to deliver a guaranteed resolution of 1.6nm at a low accelerating voltage of 1 kV. In parallel with high-speed cross-section processing by FIB, high-resolution SEM observations and fast analyses can be conducted utilizing energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). Additionally, a ...
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  JEOL News

  The 2021 edition of the JEOL NEWS magazine is now available to download. Download here. Featured Applications: Progress in Photonic Crystal Lasers and Their Application to LiDAR And Yet It Moves: Molecular Rotors and Motors Studied by Solid-State NMR Spectroscopy Dioxins Analysis with New GC-MS/MS System and Software "TQ-DioK" Characterization of Localized Physical Properties Using High Resolution EELS In-Resin CLEM of Epon-Embedded Cells Using Fluorescent Proteins Degradation Analysis for Polymer Materials by Spin-Trapping High-Speed Electron Beam Modulation System Using Electrostatic Deflection and Laser Delivery System to the Specimen in Transmission Electron Microscopy The New Detection System of High-End FE-SEM JSM-IT800 Super Hybrid Lens ＜SHL＞ Preparation of TEM Specimens Having Specific Crystal Orientations Using FIB-SEM and EBSD ～ Applications to Allende meteorite ～ Chemical Bonding State Analysis of Boron and Phosphorus Compounds by Soft X-ray Emission Spectroscopy and Electronic Structure Calculations Chemical State Analysis of Fe in the Matrix of the Allende Meteorite Using an FEG EPMA and SXES MultiAnalyzer – Unknown Compounds Analysis System New Gas Chromatograph Time-of-Flight Mass Spectrometer JMS-T2000GC "AccuTOF™ GC-Alpha" Introduction of JEOL Products